BT Imaging Pty Ltd. (Australia)
Products
Thick Mono Slugs, As-cut Wafers, Half-processed Cells, Finished Cells and Mini Modules Inspection
Application
Qualitative imaging applicable to samples at any processing stage
Quality control and manufacturing process optimization
Features
LIS-R3
- PL: thick mono slugs, as-cut wafers, half-processed cells, finished cells and mini modules
- EL, Rs Imaging: Finished cells, mini modules
- QSS-PC Curve and Calibrated Lifetime: Half-processed cells (passivated wafers)
- IV, Suns-Voc Curves: Finished cells, mini modules
- Voc, Jmpp, Jo and Efficiency Images: Finished cells
- Front and Bulk Separation Estimation: Finished cells
- Muti-Si As-cut Wafer Analysis: As-cut wafers
- Muti-Si As-cut Wafer Analysis: As-cut wafers
- Thick Mono Slug Analysis: Thick mono slug
LIS-R3 SLUG
- PL: thick mono slugs, as-cut wafers
- Thick Mono Slug Analysis: Thick mono slug
- Muti-Si As-cut Wafer Analysis: As-cut wafers
- Muti-Si As-cut Wafer Analysis: As-cut wafers
iLS-W3
- PL: as-cut wafers, half-processed cells or finished cells
- Muti-Si As-cut Wafer Analysis: As-cut wafers
- Muti-Si As-cut Wafer Analysis: As-cut wafers
- Potential AI auto defect detection for half-processed cells
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[ LIS-R3 ] -
[ ILS-W3 ]
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